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Frequent JJ decoupling is the main origin of AC losses in the superconducting state

机译:频繁的JJ去耦是aC损耗的主要来源   超导状态

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摘要

The origins of AC losses in the high Tc superconductors are not addressedadequately in literature. We found out, frequent Josephson Junction (JJ)decoupling (both intergranular and the interlayer) due to the flow of ACcurrent is one of the main origins of the AC losses in high Tc superconductors.We have determined the AC losses in superconductors in the rf range bymeasuring the absolute value of non-resonant rf power absorbed by the samples.Our data shows that under certain conditions when both the number density ofJJs present in the sample and the JJ critical current cross a threshold value,AC losses in the superconducting state keeps on increasing with decreasingtemperature below Tc. The underlying mechanism is an interesting interplay ofJJ coupling energy and the amplitude of rf voltage applied to the sample. Theeffect of an applied magnetic field, variation of rf frequency and temperaturewere studied in detail. To find out the exact relation between the JJ couplingenergy, JJ number density, applied AC frequency, the amplitude of AC currentand the AC losses in superconductors, we have studied samples of differentcrystalline properties, different grain sizes, pressurized with differentpressure and sintered at different physical and chemical situations. Theimplementations of these results are discussed. These results have importantimplications for the understanding of the origin of AC losses andcharacterization of superconducting samples. In this paper we also extend thecapability of the AC losses studies in superconductors for the characterizationof materials for device applications.
机译:高Tc超导体中AC损耗的起因在文献中并未得到充分解决。我们发现,交流电流的流动导致频繁的约瑟夫逊结(JJ)去耦(晶界和层间)是高Tc超导体交流损耗的主要来源之一。我们已经确定了射频超导体中的交流损耗我们的数据表明,在某些条件下,当样品中存在的JJ的数量密度和JJ临界电流都超过阈值时,超导状态下的AC损耗保持不变。随着温度降低到低于Tc而增加。潜在的机制是JJ耦合能量和施加到样品的RF电压幅度之间有趣的相互作用。详细研究了外加磁场,射频频率和温度变化的影响。为了找出JJ耦合能,JJ数密度,施加的AC频率,AC电流的幅值和超导体中的AC损耗之间的确切关系,我们研究了不同晶体性质,不同晶粒尺寸,不同压力加压并在不同物理条件下烧结的样品和化学情况。讨论了这些结果的实现。这些结果对理解交流损耗的起源和超导样品的表征具有重要意义。在本文中,我们还扩展了超导体中交流损耗研究的能力,以表征器件应用材料。

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